InGaAs short wave infrared SWIR cameras deliver 640x512 resolution with response up to 1.7 micron.
The high resolution SWIR camera can be used for a very wide variety of applications including laser beam profiling, semiconductor inspection, hyperspectral imaging, on-line process control, Low-light level imaging, and screening solar cells.
For solar cells screening, defects at early processing stage can be imaged through the bulk silicon thanks to its transparency at wavelengths beyond 1.1 micron. Cracks, dead or weak responding areas are unveiled on sliced wafers, enabling automatic sorting / selection of the best pieces. The camera finally captures faint electroluminescence (EL) and photoluminescence (PL) emissions from individual photovoltaic cells that are directly proportional to their efficiency.
PSEL high resolution SWIR cameras can be supplied with state of art SWIR optics which will deliver superior resolution / contrast modulation and lower distortion than conventional NIR optics that are used with conventional CCD cameras.