InGaAs short wave infrared SWIR cameras deliver 640x512 resolution with response up to 1.7 µm.
The high resolution SWIR camera can be used for a very wide variety of applications including laser beam profiling, semiconductor inspection, hyperspectral imaging, on-line process control, Low-light level imaging, and screening solar cells.
For solar cells screening, defects at early processing stage can be imaged through the bulk silicon thanks to its transparency at wavelengths beyond 1.1 µm. Cracks, dead or weak responding areas are unveiled on sliced wafers, enabling automatic sorting / selection of the best pieces. The camera finally captures faint electroluminescence (EL) and photoluminescence (PL) emissions from individual photovoltaic cells that are directly proportional to their efficiency.
Photonic Science high resolution SWIR cameras can be supplied with state of art SWIR optics which will deliver superior resolution / contrast modulation and lower distortion than conventional NIR optics that are used with conventional CCD cameras.
14-bit digitization / 16-bit image processing
Read out noise
down to typically <30 electrons
With Region of Interest ROI
Response to varying intensities and/or exposures
Gigabit Ethernet & Camera Link interface
SDK kit, Labview VI’s
Available with passive cooling
SWIR handheld vision enhancement
SWIR airborne payload
Photoluminescence for solar cells
Available for long exposure applications
with air cooling or water cooling
Laser beam profiling
Semiconductor failure inspection
Multispectral imaging and spectroscopy
Single-walled nanotubes (SWNTs) deep tissue imaging
Singlet oxygen imaging
Photoluminescence imaging of photovoltaic materia